FEI HELIOS 400

FEI HELIOS 400

DESCRIPTION

System
ELSTAR SEM Column
Sidewinder FIB Column: 20 nA
Through Lens Detector (TLD)
Flip stage
CDEM Detector
STEM Detector
Retractable BSD
Platinum GIS
Carbon GIS
Cryo cleaner cold trap
Subnanometer SEM and STEM Imaging
OMNIPROBE 200 Manipulator

制作商:FEI
设备状态:正常使用